Near-Field Measurements

Near field measurements are usually performed using a specialized probe that is placed close to the antenna under test. The probe measures the electric and magnetic fields, and the data is used to calculate the radiation pattern and other antenna parameters. There are different types of probes that can be used for near field measurements, including simple loop probes, planar probes, and spherical probes.

In addition to the specialized probe, near field measurements require sophisticated software and instrumentation to process the data and generate accurate results.

The measurements can also be affected by environmental factors such as temperature, humidity, and nearby objects, so careful calibration and testing are necessary to ensure accurate results.

Dual-linearly polarized waveguide probes are widely used in near-field measurement applications. These probes utilize two orthogonally polarized modes to measure both the electric and magnetic fields of a device under test, providing more complete characterization of the device's electromagnetic behavior.

In near-field measurement applications, dual-linearly polarized waveguide probes offer several advantages. For example, they allow for high-resolution measurements of the electric and magnetic fields near the surface of a device, which can be used to extract important parameters such as the resonant frequency, radiation pattern, and polarization characteristics of the device.

Dual-linearly polarized waveguide probes are also useful in situations where the device under test has complex polarization characteristics, such as circular or elliptical polarization. In these cases, the dual-polarization capability of the probe allows for accurate measurement of both the magnitude and direction of the electric and magnetic fields, enabling a more complete characterization of the device's behavior.

Overall, the application of dual-linearly polarized waveguide probes in near-field measurement is an effective technique for characterizing the electromagnetic properties of various types of devices, including antennas, filters, amplifiers, and other microwave components. By utilizing these probes, researchers and engineers can better understand the behavior of their devices, leading to improved performance and functionality.

Lorentz offers a line of dual-linearly polarized high-performance probes covering 12.0-40.0 GHz. These probes are designed specifically for near-field antenna measurements with typical gain 9±2 dBi.

Features

• Dual-linear polarization

• Excellent cross-polarization discrimination

• High port isolation

• Broad, stable beamwidth

• No pattern nulls in the main lobe range

• Low interaction between probe and AUT

Applications

• 5G NR OTA testing
  

• Phase array testing
  

• Satellite antenna testing

• General antenna testing

• Radome testing

• Wireless communication

Solution for

• Near-field antenna measurements

• Calibration and polarization reference

Customization services

• Custom mount options

• Precision polarization alignment unit

• Length of probe

• RF interface
  

• Operating frequency

• Coating color

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